Characterization of E2V CCD 203_82 with Low Noise AACAS Controller
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE（2008）
Key words
CCD,Readout noise,CTE,EPER,Dark Current,Fe-55 X-ray,Gain
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined