The design of the sagittal focusing monochromator for XAFS measurement at NSRL

The main project of XAFS bean-dine upgrading at NSRL is to replace the double crystal monochromator with the sagittal-focusing one, of which the diffraction and the focus are compatible. It will increase the photon intensity more than 5 times on the sample with M=1:4.88 geometry and 3x0.1 mrad(2) acceptance divergence (HxV) without other changes at the primary beamline configuration. This paper introduces concept design of the sagittal-focusing monochromator including optical design, parameters calculation, heat load analysis, mechanical analysis of the flexural hinge-based bender and the mechanism of dynamically energy scanning.