Package Level Simulation And Verification Of Microsystems

2007 IEEE SENSORS, VOLS 1-3(2007)

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摘要
This paper presents a modified concept of a generalized Nodal Analysis Method (NAM) to theoretically model the packaged MEMS device and simplify the package-level simulation of microsystems. Non-device elements are included and a new kind of distributed node is defined to expand the usability of NAM. Experiment verification based on DSCM and LDV are also carried out to validate the simulated results.
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microsystems
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