A novel method for defect location using IDDQ

Burong Xu,Hongbing Xu,Ying Deng,Houjun Wang

Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference（2004）

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摘要

A novel algorithm for fault location using IDDQ has been presented in this paper. A significant advantage of this method is that it could effectively locate multiple defects in a circuit. Experiment used to illuminate this algorithm is discussed in details.

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关键词

fault location,iddq testing,multiple faults,iddq,automation,vlsi circuits,fault detection,voltage,vlsi

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