Effects Of Different Surface Treatment Of Czt Sample On The Values Of Dcrc Fwhm Of X-Ray Diffraction

Cd1-yZnyTe (CZT) wafers with [111] orientations, which serve as the common substrates for Hg1-xCdxTe (MCT) epitaxial deposition, were treated with different processes of mechanical polishing and chemical etching and then tested by X-ray diffraction unit with the same experimental conditions. The conclusion is that the sample surface treatment dramatically influence the values of DCRC FWHM (Full Width at Half Maximum of Double Crystal Rocking Curves). The most desirable process and it's experimental conditions for accurate measurement of DCRC FWHM have also been reported in this paper.