Research on the failure prediction of electrical connectors at high temperature

This paper mainly studies one kind of failure prediction method on electrical connectors at high temperature. One scheme of high temperature reliability test was provided based on the theory of constant stress accelerated life test. The test device was designed; the test data was analyzed. It can be seen that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) there is a tendency toward slightly higher value of contact resistance for each low temperature stress; 3) the higher the test temperature stress, the larger the value of contact resistance, but the difference in contact resistance is not very big. 4) The data prediction method such as the gray theory model is helpful for rapid failure prediction of electrical connectors at high temperature.