Giant electroresistance induced by electric currents in epitaxial thin films of Pr0.7Sr0.3MnO3

Electric-current induced electroresistance effect has been investigated in epitaxial Pr0.7Sr0.3MnO3 thin film grown on the (100) SrTiO3 substrate. A significant change similar to 38% in the ratio of the peak resistance at different currents with a current density up to similar to 3.3 x 10(3) A/cm(2) was achieved. Such an ER effect is more remarkable in comparing with that reported in other manganite oxides with similar current densities. Compared with that of the as-grown films, the electroresistance of the post-annealed films is smaller, while the ER effect (similar to 14%) is obtained. Although the nature behind such an electroresistance effect has not been well understood, the field tunability of the metal/insulator transition and the electroresistance effect induced by currents might be of potential for various applications such as filed effect devices.