X-ray photoemission spectroscopy studies of indium-tin-oxide films treated by oxygen plasma immersion ion implantation

Optics InfoBase Conference Papers(2012)

Cited 0|Views7
No score
Abstract
Oxygen plasma immersion ion implantation (PIII) was introduced to modify indium-tin-oxide (ITO) films. X-ray photoemission spectroscopy (XPS) was employed to characterize the elements ratio and core level spectra of O1s at the surface of ITO. © 2012 OSA.
More
Translated text
Key words
null
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined