Ferroelectric And Dielectric Properties Of 0.62pb(Mg1/3nb2/3)O-3-0.38pbtio(3) Thin Films On La0.6sr0.4coo3 Buffered Si Substrates

0.62Pb(Mg1/3Nb2/3)O-3-0.38PbTiO(3) (0.62PMN-0.38PT) thin films were deposited on La0.6Sr0.4CoO3 (LSCO) buffered Si substrates by radio-frequency magnetron sputtering. It has been found that the 0.62PMN-0.38PT films show a (1 0 0) preferred oriented perovskite phase on (1 0 0) preferred oriented LSCO layer while they show a (1 1 0) preferred perovskite phase on (1 1 0) preferred oriented LSCO layer. The formations of such preferred orientations are attributed to co-contribution of the surface energy and lattice-match interface energy. The (1 1 0) preferred oriented 0.62PMN-0.38PT film exhibits a relatively low remnant polarization of 12.1 mu C/cm(2) while a low coercive field of 27 kV/cm compared with (1 0 0) preferred oriented one (13.9 mu C/cm(2), 56 kV/cm). Moreover, the (1 1 0) preferred oriented film shows a larger dielectric constant of similar to 2260 and a lower dielectric loss of 0.09 at 1 kHz than those of (1 0 0) preferred oriented one (1050 and 0.19). The results demonstrate that the enhanced ferroelectric and dielectric properties are achieved for (1 1 0) preferred oriented film, which is correlated with large anisotropy in the texture films induced by LSCO buffer layers. Crown Copyright (C) 2012 Published by Elsevier B.V. All rights reserved.