Orthopositronium annihilation and emission in mesostructured thin silica and silicalite-1 films

Mesoporous silica films and MFI-type pure silica zeolite films were investigated using slow positrons. Detection of the 3γ annihilation fraction was used as a quick test to estimate the emission of orthopositronium (o-Ps) into vacuum. Positronium time-of-flight (TOF) spectroscopy, combined with Monte-Carlo simulation of the detection system was used to determine the energy of o-Ps emitted from the films. Evidence for an efficient o-Ps emission was found in both the mesoporous and silicalite-1. A 3γ fraction in the range of 31–36 % was found in the films with the highest o-Ps yield in each type of porous material, indicating that 40–50 % of the implanted positrons form positronium in the pore systems with very different pore sizes. Time-of-flight measurements showed that the energy of the orthopositronium emitted into vacuum is below 100meV in the film with 2–3nm pores at 3keV positron energy, indicating an efficient slowing down but no complete thermalization in the porous films of 300–400nm thickness.