一种用于X射线安全检测的多通道电荷读出IC

Microelectronics(2013)

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Abstract
介绍了一种用于X射线安全检测的多通道电荷读出集成电路。该电路可提供32通道的探测器电荷-模拟电压转换,具有无死区时间、失调校准和低噪声特性。电路由电荷放大器增益控制、时序发生器、移位寄存器链、电荷放大器阵列、采样保持放大器和驱动器等组成。芯片采用华润上华0.6μm标准CMOS工艺实现,管芯尺寸为3.1mm×7.1mm,工作在3.3MHz,5V供电和3.5V参考电压下的功耗为45mW。测试结果表明,在25.5pF的电荷放大器增益电容和52pF的光电二极管结电容下,电路的输出噪声性能达到90μV(Vrms)。
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Key words
Charge readout IC,Security inspection,Dead time,Offset calibration
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