Femtosecond Time-Resolved Imaging Interferometry: A Technique To Investigate Ultrafast Phenomena In Solids

Vasily V Temnov,K Sokolowskitinten,Peng Zhou,D Von Der Linde

2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5（2007）

引用 45|浏览4

暂无评分

摘要

Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics. (C) 2000 Optical Society of America

查看译文

关键词

dielectric materials,deformation,solids,surface structure,dielectrics,optical interferometry,refractive index,optical pumping

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要