Comparisons of Design and Yield for Large-Area 10-kV 4H-SiC DMOSFETs

IEEE Transactions on Electron Devices(2008)

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Abstract
Three large-area 10-kV 4H-SiC DMOSFET designs are compared with respect to their design, die area, breakdown yield, and ON-state yield. The largest of these DMOSFETs had 0.62 cm2 of active area on a 1-cm2 die, with a 10-kV device producing 40 A at a gate field of 3 MV/cm. Two designs used linear interdigitated fingers, whereas the third design used a square cell layout. The linear interdigitated f...
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Key words
field effect transistor switches,integrated circuit yield,power MOSFET,power semiconductor switches,semiconductor device breakdown,semiconductor device models,silicon compounds
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