A generalized model for the lifetime of microelectronic components, applied to storage conditions

To improve the quality of microcircuit lifetime prediction in storage and non-operating conditions, a new model, based on physical principles and generally applicable to microcircuits, is proposed. This model is derived from the fundamentals of manufacturing yield statistics and uses compound Poisson statistics with a time-dependent negative binomial shaping function. Comparison of the model to statistical distributions created from available data shows that the model is applicable to many situations that may occur in actual populations.