Current Mode Monolithic Active Pixel Sensor With Correlated Double Sampling forCharged Particle Detection

Sensors Journal, IEEE(2007)

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摘要
A monolithic active pixel sensor operating in current mode for charged particle detection is described. The sensing element in each pixel is an n-well/p-sub diode with a PMOS transistor integrated in an n-well. The drop of the n-well potential from the collection of charge modulates the transistor channel current. Each pixel features two current mode memory cells. The subtraction of distant-in-time samples frees the signal of fixed pattern noise (FPN) and of the correlated low-frequency temporal noise components, resulting in extraction of the particle footprint. The subtraction circuits are placed at each column end. A transimpedance amplifier, integrating in sequence two current samples and subtracting the results in an arithmetic operation, was adopted. The integrated version of the transimpedance amplifier, designed with a maximized conversion gain, is burdened by a risk of an early saturation, imperiling its operation, if the dispersions of the dc current component are too big. The degree of dispersions could not be estimated during the design. Some number of columns is available as a backup with the direct current readout. An external realization of the subtracting circuit, based on the same principle, is used to process direct output columns. The concept of the data acquisition setup developed, the tested performance of an array of cells, and the processing circuitry are described
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关键词
MOSFET,current-mode circuits,image sensors,particle detectors,semiconductor diodes,PMOS transistor,charged particle detection,correlated double sampling,current integrating transimpedance amplifier,current mode imager,current mode memory cells,current mode sensor,data acquisition,fixed pattern noise,monolithic active pixel sensor,n-well diode,p-sub diode,parallel column readout,particle detector,particle footprint,subtraction circuits,temporal noise components,Active pixel sensors,correlated double sampling,current integrating transimpedance amplifier,current mode imager,parallel column readout,particle detector
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