Recent Results Using Synchrotron Radiation For Energy-Dispersive X-Ray-Fluorescence Analysis

Results obtained using synchrotron radiation as an excitation source for energy-dispersive analysis are reviewed. Practical experience gained in the use of tunable, monochromatic excitation for trace analysis of various types of samples is discussed. Advantages and limitations associated with specific synchrotron radiation properties are evaluated. In particular, the influence of multiple inelastic scattering and resonant Raman scattering on limiting the degree of detectability improvements associated with energy tuning is demonstrated. A scanning x-ray microprobe employing multilayer mirrors as focusing elements is described. Measurements performed with this system have demonstrated the capability of detecting femtogram quantities of trace elements in a 10 × 10 μm area.