Two-Dimensional Junction Profiling in the Specific Site by Chemical Delineation and Electron Holography

J-M Yang, JH Yoo, H-S Seo, K-J Park,Y-C Park, W-J Hwang,JJ Kim,D Shindo

Microscopy and Microanalysis（2007）

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摘要

Extract Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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关键词

electron holography,chemical delineation,two-dimensional

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