Segmented Foil Sem Grids At Fermilab

S. Kopp,D. Indurthy,M. Proga,R. Zwaska,B. Baller,S. Childress,R. Ford,D. Harris, C. Kendziora,C. Moore,G. Tassotto

2005 IEEE PARTICLE ACCELERATOR CONFERENCE (PAC), VOLS 1-4（2005）

Cited 3|Views16

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Abstract

We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 mu m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.

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Key words

strips,secondary electron emission,physics,thermal expansion,heating

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