Surface enhanced resonant Raman scattering induced by silver thin films close to the percolation threshold

PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS(1997)

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摘要
The electromagnetic field of an incoming wave has already been found to be enhanced close to the surface of a thin granular or rough silver film. We use Surface Enhanced Resonant Raman Scattering (SERRS) as a test of this enhancement close to the percolation threshold (p(c)). The scattered light shows a maximum below p(c), then a minimum close to p(c) and goes up above.
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关键词
granular thin films,rough surface,resonant Raman scattering,percolation threshold
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