红外焦平面探测器杜瓦组件真空寿命分析
Laser & Infrared(2011)
Abstract
介绍了探测器杜瓦组件的加速寿命试验方法,对用于某机载红外热成像系统长波576×6 HgCdTe红外焦平面探测器组件的无维护真空寿命进行了分析,结果表明,产品真空寿命超过10年(可靠度为95%),满足产品应用要求。
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Key words
accelerated life testing,vacuum life,IDDA
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