Testing of Bulk Radiation Damage of N-in-p Silicon Sensors for Very High Radiation Environments
K. Hara,A. A. Affolder,P. P. Allport,R. Bates,C. Betancourt,J. Bohm,H. Brown,C. Buttar,J. R. Carter,G. Casse,H. Chen,A. Chilingarov,V. Cindro,A. Clark,N. Dawson,B. DeWilde,F. Doherty,Z. Dolezal,L. Eklund,V. Fadeyev,D. Ferrere,H. Fox,R. French,C. Garcia,M. Gerling,S. Gonzalez Sevilla,I. Gorelov,A. Greenall,A. A. Grillo,N. Hamasaki,H. Hatano,M. Hoeferkamp,L. B. A. Hommels,Y. Ikegami,K. Jakobs,J. Kierstead,P. Kodys,M. Koehler,T. Kohriki,G. Kramberger,C. Lacasta,Z. Li,S. Lindgren,D. Lynn,P. Maddock,I. Mandic,F. Martinez-McKinney,S. Marti i Garcia,R. Maunu,R. McCarthy,J. Metcalfe,M. Mikestikova,M. Mikuz,M. Minano,S. Mitsui,V. O'Shea,U. Parzefall,H. F. -W. Sadrozinski,D. Schamberger,A. Seiden,S. Terada,S. Paganis,D. Robinson,D. Puldon,S. Sattari,S. Seidel,Y. Takahashi,K. Toms,D. Tsionou,Y. Unno,J. Von Wilpert,M. Wormald,J. Wright,M. Yamada Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment（2010）
Key words
p-Bulk silicon,Microstrip,Charge collection,Radiation damage
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