Biparametric correction methods using two shapers for In/CdTe/Pt radiation detector
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment(2011)
摘要
Biparametric correction methods have reportedly been used to improve the energy resolutions of CdTe or CdZnTe radiation detectors. There are two methods for the correction. One is a method that uses the rise time and pulse height, and the other is a method that uses two pulse heights acquired from a fast and a slow shaper. The latter one for a 2.3-mm-thick In/CdTe/Pt radiation detector was investigated for this paper. The polarization effect resulting in short-term instability in the energy spectrum should be resolved before an In/CdTe/Pt detector is used. A pulsed bias voltage shutdown technique was used with the two shaper biparametric correction method to overcome both the polarization effect and the incomplete carrier collection. An energy resolution of 4.6% for a 122keV peak was observed for a 2.3-mm-thick In/CdTe/Pt detector at 35°C for 2h after applying a bias voltage of −800V. Furthermore, the energy resolutions are improved for all the photo peaks when a constant correction factor is applied to the five photo peaks in the energy range 59.5–1333keV.
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关键词
CdTe,Radiation detector,Correction method,Energy resolution
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