A Scalable Built-In Self-Recovery (bisr) Vlsi Architecture and Design Methodology for 2D-Mesh Based On-Chip Networks

Kun-Chih Chen,Shu-Yen Lin,Wen-Chung Shen,An-Yeu (Andy) Wu

Design Automation for Embedded Systems（2011）

引用 7|浏览10

关键词

On-Chip Networks (OCN),Built-In Self-Recovery (BISR),Surrounding Test Ring (STR),Design-for-Testability (DfT),Through-Path Fault-Tolerant (TP-FT) routing

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