Intergrowth microstructures of MnF2 subjected to shock compression
PHILOSOPHICAL MAGAZINE(2009)
摘要
Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and alpha-PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile- type but not the alpha-PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.
更多查看译文
关键词
shock compression,intergrowth,ledge structure,electron diffraction,high-resolution transmission,electron microscopy image
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要