谷歌浏览器插件
订阅小程序
在清言上使用

Intergrowth microstructures of MnF2 subjected to shock compression

PHILOSOPHICAL MAGAZINE(2009)

引用 0|浏览4
暂无评分
摘要
Intergrowth microstructures of MnF2 subjected to shock compression at 4.4, 9.0 and 21.6 GPa were examined using transmission electron microscopy (TEM). Intergrowth microstructures consisting of rutile- and alpha-PbO2-type phases were observed in samples shock-loaded to 4.4 and 9 GPa. The sample subjected to 21.6 GPa consisted of a twin structure with stacking faults, with a rutile- type but not the alpha-PbO2-type phase. In the 9.0-GPa shocked sample, the phase ledge structure originating from a phase transition is directly captured by high-resolution transmission electron microscopy.
更多
查看译文
关键词
shock compression,intergrowth,ledge structure,electron diffraction,high-resolution transmission,electron microscopy image
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要