BESⅢ上τ轻子对产生阈附近衰变分支比测量的模拟研究
HUA Chun-fei,MO Xiao-hu,LI Yu-xiao,BIAN Jian-ming,CAO Guo-fu,CAO Xue-xiang,CHEN Shen-jian,DENG Zi-yan,FU Cheng-dong,GAO Yuan-ning,HE Kang-lin,HE Miao,HUANG Bin,HUANG Xing-tao,JI Xiao-bin,LI Hai-bo,LI Wei-dong,LIANG Yu-tie,LIU Chun-xiu, LIU Huai-min,LIU Qiu-guang,LIU Suo,MA Qiu-mei,MA Xiang,MAO Ya-jun,MAO Ze-pu,PAN Ming-hua,PANG Cai-ying,PING Rong-gang,QIN Ya-hong,QIU Jin-fa,SUN Sheng-sen,SUN Yong-zhao,WANG Ji-ke,WANG Liang-liang,WEN Shuo-pin,WU Ling-hui,XIE Yu-guang, XU Min,YAN Liang,YOU Zheng-yun,YU Guo-wei,YUAN Chang-zheng,YUAN Ye,ZHANG Chang-chun,ZHANG Jian-yong,ZHANG Xue-yao,ZHANG Yao,ZHENG Yang-heng,ZHU Yong-sheng,ZHU Zhi-li,ZOU Jia-heng Nuclear Electronics & Detection Technology（2009）
Abstract
利用BESⅢ的离线软件系统模拟τ轻子对在其产生阈处衰变到包含eμ和eπ子的末态;借助粒子鉴别软件对衰变末态进行筛选,得到相应的探测效率及本底比率,由此估算出相应于特定统计误差精度要求的数据获取时间。
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Key words
eμand eπ final states,Monte Carlo study,branching ratio,τ threshold
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