AFM and STM Investigations of Electroluminescent SiO2/Si Superlattices Prepared by Chemical Vapour Deposition
Solid State Phenomena(1997)
摘要
Chemical vapour deposition in low pressures has been used to prepare SiO2/Si superlattices of 1-3 nm in thickness in order to manufacture electroluminescent components. The AFM and STM studies are presented for investigation of surface morphology and electrical properties of superlattice. The current-voltage characteristic and the electro-luminescence spectrum are also shown.
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关键词
electroluminescence,SiO2/Si superlattice,AFM,STM,CVD
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