Dielectric Properties of Pb(Zr,Ti)O₃ Heterolayered Thick Films Fabricated by Screen-Printing Method

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 pm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss ofthe PZT thick films sintered at 1050 degrees C were 283 and 1.90%, respectively.