Quasi-static and dynamic switching of exchange biased micron-sized TMR junctions

We study the quasi-static and dynamical switching of magnetic tunnel junction patterned in micron-sized cells with integrated field pulse line. The tunnel junctions are CoFe/AlO/CoFe with an exchange biasing layer of MnIr. Quasi-static characterizations have been used to determine anisotropy, coercive as well as exchange bias fields. Dynamic switching measurements are done by applying fast-rising magnetic field pulses (178ps–10ns) along the hard axis of the junction with a quasi-static easy-axis applied field. We identify the field conditions leading to no-switching, to direct-writing and to toggle switching. We identify these field conditions up to the precessional limit, and construct the experimental dynamical astroïd. The magnetization trajectories leading to direct-writing and to toggle switching are well described by macrospin simulations.