Depth Profile Investigations of Metallic Layer Contacts to GaAs(100) and InP(100) by Means of Auger Electron Spectroscopy and Sputter Technique
Fresenius Journal of Analytical Chemistry(1991)
关键词
Inorganic Chemistry,GaAs,Chemical Shift,Auger,High Stability
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要