Diffuse-dynamic multiparameter diffractometry: A review

V. B. Molodkin,A. P. Shpak,M. V. Kovalchuk,V. L. Nosik,V. F. Machulin

Crystallography Reports（2010）

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摘要

The results reported at the Conference on Application of X-Rays, Synchrotron Radiation, Neutrons, and Electrons in Nano-, Bio-, Information-, and Cognitive Technologies (RSNE-NBIC 2009) are briefly reviewed. This review is based on a cycle of studies [1–6] where a new method for studying the structure of real crystals—diffuse-dynamic multiparameter diffractometry (DDMD)—was proposed and substantiated.

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关键词

GaAs,Crystallography Report,Diffuse Scattering,Diffuse Component,Waller Factor

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