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High Resolution Hard X-ray Photoemission Using Synchrotron Radiation As an Essential Tool for Characterization of Thin Solid Films

J. J. Kim,E. Ikenaga,M. Kobata,A. Takeuchi,M. Awaji,H. Makino,P. P. Chen,A. Yamamoto, T. Matsuoka,D. Miwa,Y. Nishino,T. Yamamoto,T. Yao,K. Kobayashi

Applied Surface Science（2006）

Cited 22|Views28
Key words
high resolution hard X-ray photoemission spectroscopy,InN,oxygen incorporation
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