Erratum: Soft-X-ray spectra of highly charged Os, Bi, Th, and U ions in anelectron beam ion trap

Systematic variation of the electron-beam energy in an electron-beam ion trap has been employed to produce soft-X-ray spectra of Os, Bi, Th, and U with the highest charge states ranging up to Ni-like ions. Guided by relativistic atomic structure calculations, the strongest lines have been identified with Delta n = 0 (n = 4 to n' = 4) transitions in Rb- to Cu-like ions. The rather weak 4p-4d transitions are much less affected by QED contributions than the dominant 4s-4p transitions. Our wavelength measurements consequently provide benchmarks with and (almost) without QED. Because the radiative corrections are not very sensitive to the number of electrons in the valence shell, our data, moreover, provide benchmarks for the evaluation of electron-electron interactions.