Eine neuartige Lösung für Test und Debugging in vernetzten eingebetteten Systemen

Summary  Due to the increasing complexity of embedded systems, trends towards highly integrated and distributed solutions as well as the advent of multi-processor architectures the tasks of debugging and testing become more and more important. Since existing technologies and tools entirely neglect the distributed character of many applications a radically new patent-registered concept was developed at the University of Applied Sciences Technikum Wien which is notably suitable to be integrated in system-on-chips. This work presents the new concept as well as results from a prototype implementation which is compared to traditional approaches for test and debugging of embedded systems.