Study of the formation of InGaN quantum dots on GaN surface
Bulletin of the Russian Academy of Sciences: Physics(2009)
摘要
The effect of growth temperature on the surface morphology of InGaN layers with quantum dots (QDs) on GaN surface has been studied. The optimal conditions for formation of a dense uniform InGaN/GaN QD array with lateral sizes of 20–30 nm, which is characterized by long-wavelength photoluminescence in the range of 420–470 nm, are found.
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关键词
Atomic Force Microscope Image,Quantum Well,InGaN Layer,Atomic Force Microscope Analysis,InGaN Island
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