An Oscillation-Based Test Structure For Timing Information Extraction

Technology scaling introduces many sources of variability and uncertainty that are difficult to model and predict [3]. The result of these uncertainties is a degradation in our ability to predict the performance of fabricated chips, i.e., a lack of model-to-hardware matching. The prediction of circuit performance is the result of a complex hierarchy of models starting at the basic MOSFET device model and rising to full-chip models of important performance metrics like power, frequency of operation, etc. The assessment of the quality of such models is an important activity, but it is becoming harder and more complex with rising levels of variability, as well as with the increase in the number of systematic effects observed in modern CMOS processes. The purpose of this paper is to introduce a special-purpose test structure that specifically focuses on ensuring the accuracy of gate timing models. The certification of digital design correctness (the so-called signoff) is based largely on the results of performing a Static Timing Analysis (STA) [15], [18], which, in turn, is based entirely on the gate timing models. Our test structure compares favorably to alternative approaches; it is far easier to obtain the desired results than direct delay measurement, and it is much more general than simple ring oscillator structures. Further, the structure is specified at a high level, allowing it to be synthesized using a standard ASIC place-and-route flow, thus capturing the systematic local layout effects which can sometimes be lost by simpler (e. g., ring oscillator) structures. Experimental results show the structure can play an important role in identifying mismatches between timing models and observed hardware.