Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

JOURNAL OF PHYSICS-CONDENSED MATTER(2005)

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摘要
Two photoemission electron microscopy (PEEM) systems with different characteristics have been introduced in SPring-8 for a nanotechnology support project. One is an easy to use system (ELMITEC PEEMSPECTOR), which is equipped with an electrostatic lens. The other one is a high end system spectroscopic photoemission and low energy electron microscope (ELMITEC LEEM/PEEM III), which is equipped with a magnetic lens and an energy filter. Test experiments have been done using the PEEM systems and high quality x-rays at SPring-8. In this paper, some experimental results will be presented.
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关键词
secondary emission,electrostatic lenses,lenses,microscopy,microscopes,electron microscopes,nanostructures,electron microscopy,electron emission,electromagnetic radiation,electron microscope
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