TEM sample preparation of YBCO-coated conductors: conventional method and FIB
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany（2008）
Abstract
YBa2Cu3O7-δ (YBCO)-coated conductors prepared by the chemical solution deposition process (CSD) are currently of great interest for industrial
applications. A flexible nickel tungsten substrate is dip-coated in a buffer layer and a YBCO precursor solution. The resulting
thin films systems have a high misfit. TEM sample preparation is challenging and is a fundamental issue for the characterization
of YBCO-coated conductors.
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Key words
thin films, interfaces, coated conductors
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