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Investigation of interfacial delamination of a copper-epoxy interface under monotonic and cyclic loading: modeling and evaluation

Advanced Packaging, IEEE Transactions(2003)

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Abstract
Interfacial delamination is of important concern for multilayered microelectronic packages, as it is one of the most common failures observed after reliability test. Most of the work, available in open literature, focus on delamination propagation under monotonic loading rather than delamination propagation under cyclic loading. Interfacial fracture mechanics based methodologies have been proven to be efficient in handling interfacial delamination problem under monotonic loading. In this paper, the principles of interfacial mechanics have been applied in the analysis of interfacial fatigue crack propagation. Fatigue test has been conducted in studying onset of delamination and fatigue crack propagation (FCP) of an interfacial crack along a copper-epoxy interface. Models developed in this study have also been applied in the evaluation of multilayered integrated substrate test vehicles.
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Key words
interfacial integrity,plastic ball grid array,integrated circuit interconnections,plastic packaging,integrated circuit reliability,multilayered microelectronic packages,internal stresses,copper-epoxy interface,copper,cyclic loading,fatigue cracks,reliability test,fatigue crack propagation,interfacial delamination,finite element analysis,monotonic loading,integrated circuit packaging,numerical modeling,fracture mechanics methodologies,cu,delamination,ball grid arrays,fracture mechanics,indexing terms
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