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半导体激光器热弛豫时间测试技术研究

Chen Chen,Xin Guofeng,Liu Rui,Qu Ronghui,Fang Zujie

Acta Photonica Sinica（2006）

Cited 2|Views10
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Abstract
利用脉冲工作状态下半导体激光器激射光谱随结温升高发生红移的原理,用Boxcar扫描在一定波长下的半导体激光器光功率随脉冲时间的变化信号,测得其时间分辨光谱;根据对应的峰值光功率出现时刻随波长变化的曲线,计算得到热弛豫时间参量值.利用此方法对一种半导体激光器进行了测试,得到其热弛豫时间为1.2ms.
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Key words
Time-resolved spectrum,Thermal rise-time,Laser diode,Laser technique
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