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低能高电荷态Arq+(q=12,13)离子诱发钼L壳层X射线强度的研究

XU Jin-zhang,DU Juan,XU Xu,CHEN Xi-meng,HU Bi-tao,SHAO Jian-xiong,CUI Ying,YANG Zhi-hu,ZHANG Hong-qiang,ZHANG Yi, XIAO Guo-qing,ZHANG Xiao-an, WANG Bo-yu

Journal of Atomic and Molecular Physics（2007）

Cited 23|Views21
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Abstract
本文报导了低能高电荷态Arq+(q=12,13)离子诱发的钼L壳层X射线强度随入射粒子能量的变化趋势,研究表明当入射粒子能量高于220 keV时,钼L壳层X射线强度有明显增加的的趋势.同时,我们提出了一个简单的模型去估计这种趋势随入射能量的变化.模型计算的结果与实验值符合的比较好.
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Key words
L-shell X-ray,molybdenum,argon ions,highly charged,intensity
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