低能高电荷态Arq+(q=12,13)离子诱发钼L壳层X射线强度的研究
Journal of Atomic and Molecular Physics(2007)
Abstract
本文报导了低能高电荷态Arq+(q=12,13)离子诱发的钼L壳层X射线强度随入射粒子能量的变化趋势,研究表明当入射粒子能量高于220 keV时,钼L壳层X射线强度有明显增加的的趋势.同时,我们提出了一个简单的模型去估计这种趋势随入射能量的变化.模型计算的结果与实验值符合的比较好.
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Key words
L-shell X-ray,molybdenum,argon ions,highly charged,intensity
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