Modification on surface oxide layer structure and surface morphology of niobium by gas cluster ion beam treatments

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS(2010)

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Abstract
Recently, it was demonstrated that significant reductions in field emission on Nb surfaces could be achieved by means of a new surface treatment technique called gas cluster ion beam (GCIB). Further study as shown in this paper revealed that GCIB treatments could modify surface irregularities and remove surface asperities leading to a smoother surface finish as demonstrated through measurements using a 3D profilometer, an atomic force microscope, and a scanning electron microscope. These experimental observations were supported by computer simulation via atomistic molecular dynamics and a phenomenological surface dynamics. Measurements employing a secondary ion mass spectrometry found that GCIB could also alter Nb surface oxide layer structure. Possible implications of the experimental results on the performance of Nb superconducting radio frequency cavities treated by GCIB will be discussed. First experimental results on Nb single cell superconducting radio frequency cavities treated by GCIB will be reported.
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Key words
elementary particles,performance,secondary ion mass spectrometry,superconducting radio frequency,mass spectroscopy,scanning electron microscope,field emission,atomic force microscope,niobium,materials science,molecular dynamic,computer simulation,morphology
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