Spectral analysis of the low energy Auger emission from a (0 0 0 1) ruthenium surface

Applied Surface Science(2003)

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摘要
The low energy Auger emission from a Ru(0001) surface have been analysed by means of a cylindrical mirror analyser (CMA) within the range of the electron energy (E) from 27 to 37eV as a function of the primary electron energy (Ep), which was set from 170 to 450eV in 20eV steps. Three Auger transitions at following energies: 31.7, 33.8 and 36.4eV, have been found due to application of the backscattering generation factor idea. Obtained results for the Auger transitions were verified by means of XPS results published by Fuggle et al. [Surf. Sci. 52 (1975) 521].
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关键词
Auger electron spectroscopy (AES),True secondary electron emission (TSEE),Auger electron emission generation factor,AES backscattering electron corrections,Ruthenium (Ru)
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