Identification and quantification of phases formed during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors

Applied Superconductivity, IEEE Transactions(1997)

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Abstract
Scanning electron microscopy, energy dispersive X-ray analysis (including X-ray dot mapping), X-ray diffraction and computer-based image analysis have been used to study non-superconducting secondary phases that evolve during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors. These investigations have provided new information and insights about specific alkaline earth cuprates (AECs) and lead-rich phases, We can conclusively identify (Ca,Sr)/sub 2/CuO/sub 3/, (Ca,Sr)/sub 14/Cu/sub 24/O/sub 41/ (14/24), and CuO phases, the alkaline earth plumbates, and a (Bi,Pb)-Sr-Ca-Cu-O 3221 phase with a wide range of Pb/Bi ratios. These techniques also help in differentiating voids from secondary phases and alkaline earth plumbates from the lead-rich 3221 phase.
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Key words
X-ray chemical analysis,X-ray diffraction,bismuth compounds,calcium compounds,composite superconductors,high-temperature superconductors,lead compounds,scanning electron microscopy,silver,strontium compounds,voids (solid),(Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors,(BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag,X-ray diffraction,X-ray dot mapping,alkaline earth plumbates,computer-based image analysis,energy dispersive X-ray analysis,lead-rich 3221 phase,nonsuperconducting secondary phases,scanning electron microscopy,voids
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