Theoretical Study Of The Application Of Hollow Atom Production To The Intensity Measurement Of Short-Pulse High-Intensity X-Ray Sources

We perform a theoretical study for the measurement of short-pulse high-intensity x-ray sources through the x-ray emission processes from multi-inner-shell excited states (1s(2)2s(2)2p(k)3s(2)3p(2), k = 1-4) and hollow atoms (1s(2)2s(2)3s(2)3p(2)) of Si. We discuss the effect of weak-intensity long-pulse x-rays mixed with high-intensity short-pulse x-rays and the ratio of the x-ray emission from multi-inner-shell excited states with that from hollow atoms.