Search
ChatPaper
AI Writing
analysis
Analysis
编组
Open Data
more
More
RankingsMust ReadingJournal&ConferenceAI TRAI HistoryMaster Reading TreeXiaomai's Star TalentsTrajectoryTalentNDI TrackerOpenAI sign Language
VIPCreated with Sketch.

In-Situ Observation and Characterization of Structural Evolution in a Phase-Change Memory Device by TEM-STM

D Cha,SY Park,SJ Ahn,H Horii,DK Kim,YK Kim,SO Park,UI Jung,MJ Kim,J Kim

MICROSCOPY AND MICROANALYSIS（2009）

Cited 2|Views3
No score
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
More
Translated text
Key words
memory,structural evolution,in-situ,phase-change,tem-stm
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined