A Single Shot, Sub-picosecond Beam Bunch Characterization with Electro-optic Techniques
msra(2001)
摘要
In the past decade, the bunch lengths of electrons in accelerators have
decreased dramatically to the range of a few
picoseconds \cite{Uesaka94,Trotz97}. Measurement of the length as well as the
longitudinal profile of these short bunches have been a topic of research in a
number of institutions \cite{Uesaka97,Liu97,Hutchins00}. One of the techniques
uses the electric field induced by the passage of electrons in the vicinity of
a birefringent crystal to change its optical characteristics. Well-established
electro-optic techniques can then be used to measure the temporal
characteristics of the electron bunch. In this paper we present a novel,
non-invasive, single-shot approach to improve the resolution to tens of
femtoseconds so that sub-millimeter bunch length can be measured.
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关键词
electric field
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