Chip-level and Board-Level CDM ESD Tests on IC Products
Suzhou, Jiangsu（2009）
关键词
electrostatic discharge,failure analysis,integrated circuit manufacture,integrated circuit reliability,integrated circuit testing,printed circuit manufacture,scanning electron microscopy,IC products,PCB,board-level CDM ESD,charged-device-model,chip-level ESD test,electrostatic discharge,failure analysis,high-speed receiver front-end circuit,printed circuit boards,scanning electron microscope,transient currents
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