TURN-BY-TURN SYSTEM DESIGN OF HLS

During the PhaseII project of NSRL, a turn by turn system is proposed for storage ring diagnostics which engage log-ratio electronics circuit to characterize machine properties of the updated HLS storage ring. The log-ratio processors working at 204MHz are applied to detect the varying position at two points of the ring. In this paper we will present the design performance and basic expectation of the turn-by-turn BPM electronics system in details.