Polarimetric Interferometer For Measuring Nonlinearity Error Of Heterodyne Interferometric Displacement System
中国光学快报(英文版)(2013)
摘要
This letter presents a polarimetric interferometer (PI) that can measure the ellipsometric parameter theta with an accuracy of 0.01 degrees leading to a potential accuracy of 17 pm. The PI is constructed and compared with a commercial heterodyne interferometer (HI). Given its low nonlinearity, the PI is used to measure the residual nonlinearity of a heterodyne interferometric displacement system. A rotating half-wave plate is used to compensate for a part of the nonlinearity error caused by the misalignment of the axis between input polarizing states and beamsplitter.
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关键词
heterodyne interferometric displacement system,polarimetric interferometer,nonlinearity error
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