Soft Error Resiliency Characterization on IBM BlueGene/Q Processor

Soft Error Resiliency (SER) is a major concern for Petascale high performance computing (HPC) systems. In designing Blue Gene/Q (BG/Q) [8], many mechanisms were deployed to target SER including extensive use of Silicon-On-Insulator (SOI), radiation-hardened latches [7,13], detection and correction in on-chip arrays, and very low radiation packaging materials. On the other hand, it is well known that application behavior has major impacts on the masking (or “derating” factor) in system SER calculations. The principal goal of this project is to understand the interaction between BG/Q hardware and high-performance applications when it comes to SER by performing and evaluating a chip irradiation experiment.